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Servomex – Monitoring of Ultra High Purity Gases

Designed specifically to make trace and ultra-trace measurements in a range of ultra high purity gases, the DF-750 is the leading choice in moisture analysis for the semiconductor industry. Optimized for use in 300mm semiconductor fabs, the DF-750 measures moisture as a contaminant in electronics grade nitrogen, hydrogen, helium, argon and oxygen.

• Trace level Tuneable Diode Laser (TDL) sensing provides high stability and minimal moisture contact with optical elements
• Broad detection range: 0-20ppm
• Storage and recall function: calibration, system error and measurement data facilitates archiving operational history
• Operable via front panel or digital communication options