Servomex DF-750 NANOTRACE
Servomex – Monitoring of Ultra High Purity Gases
Designed specifically to make trace and ultra-trace measurements in a range of ultra high purity gases, the DF-750 is the leading choice in moisture analysis for the semiconductor industry. Optimized for use in 300mm semiconductor fabs, the DF-750 measures moisture as a contaminant in electronics grade nitrogen, hydrogen, helium, argon and oxygen.
- Trace level Tuneable Diode Laser (TDL) sensing provides high stability and minimal moisture contact with optical elements
- Broad detection range: 0-20ppm
- Storage and recall function: calibration, system error and measurement data facilitates archiving operational history
- Operable via front panel or digital communication options
0-10V, 0-1V, 0-2V, 0-5V, 4-20 mA, Display, Tunable Diode Laser